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ChipVORX

Testonica delivers embedded Bit-Error Rate Test (BERT) technology

Testonica delivers embedded Bit-Error Rate Test (BERT) technology

The delivered solution enables quality evaluation of up to 10Gbit serial buses (PCIe Gen1/2/3, SATA, optical fiber channel, etc) with a help of powerful FPGA-embedded instrumentation technology. The technology is capable to measure Bit-Error Rate (BER) characteristic for high-speed digital data transmission links as well as to plot so-called BER eye diagram. The latter feature directly fits for mass-production testing since allows every manufactured product to be quickly checked for potential problems on high-speed channels.

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Clock frequency measurement using embedded instruments

Clock frequency measurement using embedded instruments

Testonica Lab has released universal virtual embedded instrument IP capable to measure frequencies of high-speed clock signals connected to FPGA device. The developed technology offers an easy way of checking frequencies of on-board oscillators without the need of using any kind of external test and measurement equipment. The method does not involve usage of external nail probes or any other means of physical access to oscillator’s pin.

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ChipVORX® attracts a great attention at Electronica exhibition in Munich

ChipVORX® attracts a great attention at Electronica exhibition in Munich

Artur Jutman, 10th of November, Munich, exhibition grounds. "This is absolutely fantastic" - a typical feedback that I pleasantly hear from respected audience as we are displaying our Flash Accelerator IP and accompanyig software at the GOEPEL booth A1.351.

To be correct, GOEPEL electronic, a Jena, Germany based company is displaying the first ChipVORX® product (an ultra fast flash programmer) that we at Testonica Lab have proudly developed in very tight cooperation with GOEPEL electronic's engineers.

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Embedded ChipVORX® IP Enables Ultra Fast Flash Programming

Embedded ChipVORX® IP Enables Ultra Fast Flash Programming

GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions announces the first product based on its new ChipVORX® technology at the International Test Conference (ITC'2010) in Austin, TX, USA. The new ChipVORX® based embedded instrumentation solution, developed in cooperation with the Tallinn/Estonia based Company Testonica Lab within the frame of the GATE alliance, is structured modularly as a set of ChipVORX® models and intelligent IPs.

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Goepel electronic Launches ChipVORX®, a New Embedded Instrumentation Technology

Goepel electronic Launches ChipVORX®, a New Embedded Instrumentation Technology

At the International Test Conference (ITC'2010) in Austin, TX, USA, GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions announces the development of a new ChipVORX® technology enabling support of embedded test instrumentation in connection with JTAG/Boundary Scan.

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