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Quick Instruments

Quick Instruments is a groundbreaking technology and an automated solution that provides functional test extension driven by test coverage and troubleshooting requirements. Quick Instruments populate existing on-board FPGAs converting them temporarily into a fullyautomated on-board embedded tester.

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Flash Accelerator

Flash Accelerator, a Testonica Lab developed ChipVORX® IP dramatically accelerates In-System Programming (ISP) tasks of flash memories. Flash Accelerator IP is fully integrated into CASCON system from GOEPEL electronic. Contact ChipVORX team at chipvorx[at]testonica.com

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Testonica Lab appoints EP-TeQ as the first Distributor for Quick Instruments

Testonica Lab appoints EP-TeQ as the first Distributor for Quick Instruments

Testonica Lab has just signed a contract with EP-TeQ for the sales and distribution of its Quick Instruments solutions in the Nordic, Baltic and Benelux area. "Testonica has been a valued partner of ours already for several years, so it is also a pleasure for us that their Quick Instruments are now ready for distribution", says Director at EP-TeQ, Lars Kongsted-Jensen. "It is opening new doors to us that their embedded instrument IPs now can be used in a more open and flexible way".

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Testonica delivers technology for Marginal Defect detection on DDR3/4 bus

Testonica delivers technology for Marginal Defect detection on DDR3/4 bus

Marginal Defects, such as excessive voids in solder joints, dewetting, head-in-pillow and alike do not necessarily cause malfunctions, but may result in system performance issues, increased error rates, intermittent faults and other sporadic stability issues observed in certain operation modes, at certain workloads or manifesting in a seemingly stochastic manner. As a result, Marginal Defects may lead to No Fault/Trouble Found (NFF/NTF) scenarios.

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IEEE I&M Magazine published our technical paper

IEEE I&M Magazine published our technical paper

In its Aug-Sept issue, IEEE Instrumentation & Measurement Magazine published our technical paper that was originally presented last year at AUTOTESTCON conference in Anaheim, CA. It is one of six conference papers selected for the journal on a quality basis out of the total of 80 AUTOTESTCON'2016 contributions.

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