The IEEE European Test Symposium is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing.

 

Artur Jutman shared his vision of the topic and summarized the event as follows:

"It was an utmost pleasure to participate as a panelist and have an opportunity to express my opinion as well as to debate with other panelists and the audience at the IEEE European Test Symposium in The Hague. Thanks Guilherme Cardoso Medeiros for organizing this expert panel and Said Hamdioui for a virtuoso moderation.

 

My key takeaways from the discussion are that the collaboration between the Semiconductor industry and academia
- helps reducing research-related risks for the industry and identify important research topics for academia;
- represents a career path for the talent: from university research -> to an industrial career;
- works best on a long term through building trust and smooth collaboration mechanisms;
- still has many obstacles like IP management, sensitive data sharing, result usability, etc.

 

The academic view at the panel was presented by Letícia Maria Bolzani Pöhls and Ilia Polian, while the industrial perspective was brought by Jo Gunnes and Yervant Zorian."